Geplaatst: 14 maart 2026

Geplaatst:

Geplaatst: 27 februari 2026

4-Point sheet resistance measurement/mapping of thin metals.
Used for measuring thickness of evaporated/sputter coated metals for system calibration or SPC.

Geplaatst:

The Thermo Scientific™ Nexsa™ G2 XPS System offers fully automated multi-technique analysis, for high throughput, research grade results. A high specification micro-focused Al Kα X-ray source is complemented by patented features such as co-axial, dual-beam charge compensation for insulator analysis, and reflex optical viewing to allow rapid identification and analysis of small features. The XPS SnapMap feature further enhances analysis by enabling rapid mapping of sample chemistry over small areas, to identify and detect subtle differences which may not be detectable otherwise.

Geplaatst:

CV Wafer Profiler