Geplaatst: 15 juli 2026

Metrology | Model 280 four-point prob (ILP)

The four point probe is used for automatic mapping of the sheet resistance of metals and/or epitaxial layers and doped silicon based layers.
Read out in ohm/square and measuring range is from 1 m to 800 kohm/ square
The probe head is only suitable for metal layers up to 300 nm and epitaxial layers


Geplaatst: 17 maart 2026

MPMS3

Geplaatst:

AFM Cypher-S

Geplaatst: 14 maart 2026

Probe Station MicroXact SPS-1000

Geplaatst:

AFM_Bruker