Geplaatst: 14 maart 2026
WLI_Bruker
Geplaatst:
Renishaw Raman
new laser installed 05-09-2017
Geplaatst:
AFM_Bruker
Geplaatst:
3D_Microscope_Keyence
Partially owned by ImPhys (~80%?) and KN (~20%?).
Not in cleanroom environment!
Geplaatst: 27 februari 2026
Helios 5 UX
Thermo Fisher Scienctific Helios UX 5
This FIB/SEM is equipped with micromanipulators to do TEM lamella prep. It is also equipped with EDX, STEM and a SPARC detector for elemental analysis, transmission imaging and cathodoluminescence respectively. It is also equipped with an ultra-fast beam blanker capable of reacing blanking speeds of 50 ns.
- XY range: 150 mm
- Z range: 10 mm
- Rotation: 360° (endless)
- Tilt range: -10° to +60°
- XY repeatability: 1 µm
- Compucentric rotation and tilt
- Stage biasing: 0V to -4000 V
- Electron source: Elstar column with Schottky Field Electron Gun (SFEG) and ultra-fast beam blanker
- Electron beam resolution:
- 30 kV in STEM: 0.6 nm
- 15 kV: 0.6 nm
- 1 kV (optimal WD): 0.7 nm
- 1 kV (coincident point): 1.2 nm
- 500 V with ICD detector: 1.0 nm
- Electron beam currents: 0.8 pA to 100 nA
- Electron beam acceleration voltage: 350 V to 30 kV
- Landing energy range: 20 eV to 30 keV
- FIB source: Phoenix column with gallium liquid metal ion source (Ga-LIMS)
- FIB resolution: 2.5 nm to 4.0 nm depending on method
- FIB beam currents: 1pA to 65 nA
- FIB acceleration voltage: 500 V to 30 kV
- Elstar in-lens SE/BSE detector (TLD-SE, TLD-BSE)
- Elstar in-column SE/BSE detector (ICD)
- Elstar in-column BSE detector (MD)
- Everhart-Thornley SE detector (ETD)
- IR camera for viewing inside chamber
- In-chamber secondary electron and secondary ion detector (ICE)
- Nav-cam
- Retractable solid-state backscatter electron detector (DBS)
- Retractable STEM 3+ detector with BF/DF/HAADF segments (STEM)
- Integrated beam current measurment
- 60 mm² x-ray detector (EDS, EDX)
- Gas injection systems:
- Base pressure: 2.6×10-6 mBar
- NanoBuilder software for advanced object design
- AutoScript 4 for Python based scripting
- Nanomanipulators